CVE-2018-25217
PDF Explorer 1.5.66.2 contains a structured exception handler (SEH) overflow vulnerability that allows local attackers to execute arbitrary code by overwriting SEH rec…
Published Mar 26, 2026 · updated Jun 17, 2026 · rttsoftware pdf explorer
PDF Explorer 1.5.66.2 contains a structured exception handler (SEH) overflow vulnerability that allows local attackers to execute arbitrary code by overwriting SEH records with malicious data. Attackers can craft a payload with buffer overflow, NSEH jump, and ROP gadget chains that execute when the Custom fields settings dialog processes the malicious input in the Label field.
Code
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No public source repository is identified for this product.
Timeline
Detection, updates, and resolution for this record.
Mar 26, 2026 · NIST NVD
Detected
PDF Explorer 1.5.66.2 contains a structured exception handler (SEH) overflow vulnerability that allows local attackers to execute arbitrary code by overwriting SEH records with malicious data. Attackers can craft a payload with buffer overflow, NSEH jump, and ROP gadget chains that execute when the Custom fields settings dialog processes the malicious input in the Label field.
Jun 17, 2026 · NIST NVD
Updated
PDF Explorer 1.5.66.2 contains a structured exception handler (SEH) overflow vulnerability that allows local attackers to execute arbitrary code by overwriting SEH records with malicious data. Attackers can craft a payload with buffer overflow, NSEH jump, and ROP gadget chains that execute when the Custom fields settings dialog processes the malicious input in the Label field.
Affected
- cpe rttsoftware/pdf explorer1.5.66.2
Sources
- CVE.orgVulnerability recordCVE-2018-25217
Official CVE identifier
cve.org - NIST NVDVulnerability recordCVE-2018-25217
PDF Explorer 1.5.66.2 contains a structured exception handler (SEH) overflow vulnerability that allows local attackers to execute arbitrary code by overwriting SEH records with malicious data. Attackers can craft a payload with buffer overflow, NSEH jump, and ROP gadget chains th
nvd.nist.gov