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Vulnerabilities

Vulnerability · CVE-2024-53017

Memory corruption while handling test pattern generator IOCTL command.

Published Jun 3, 2025 · catalog updated Jun 3, 2025 · Qualcomm, Inc. Snapdragon

Check if you run it

No confirmed exploitation is on record for CVE-2024-53017. EPSS is 0.09%. Act only if a listed version of Qualcomm, Inc. Snapdragon is installed.

Severity
Medium6.6
Known exploitation
Not in CISA/VulnCheck KEV
EPSS
0.09%
Remediation
Advisory link
Affected products
vendor Qualcomm, Inc. Snapdragon WCN3620

Memory corruption while handling test pattern generator IOCTL command.

Are you affected?

Enter the version you run. The result uses only the ranges stored on this record.

The check returns affected, not affected, or incomplete. It does not guess a version that is missing from the record.

  • vendor Qualcomm, Inc. Snapdragon WCN3620WCN3620

How to fix CVE-2024-53017

What to do

Three questions, each answered from this record only. Confirm the vendor advisory before you patch.

Should you patch?

No confirmed exploitation is on record for CVE-2024-53017. EPSS is 0.09%. Act only if a listed version of Qualcomm, Inc. Snapdragon is installed.

Which versions are affected?

Compare what you have installed with Qualcomm, Inc. Snapdragon WCN3620 WCN3620. Compare the installed version with the linked vendor advisory before you change production.

What should an analyst verify?

No weakness class is stored. EPSS 0.09%. There is no CISA KEV listing. No Exploit-DB or Metasploit reference is linked. Use the source links for the original advisory.

Code

The project this record applies to. Exploit listings stay in References.

No public source repository is identified for this product.

Timeline

Detection, updates, and resolution for this record.

  1. Jun 3, 2025 · EUVD

    Detected

    Memory corruption while handling test pattern generator IOCTL command.

  2. Jun 3, 2025 · EUVD

    Updated

    Memory corruption while handling test pattern generator IOCTL command.

Sources

  • FIRST EPSSExploitation probabilityCVE-2024-53017

    30-day exploitation probability 0.1%

    first.org
  • EUVDVulnerability recordEUVD-2024-54636

    Memory corruption while handling test pattern generator IOCTL command.

    euvd.enisa.europa.eu

References

Freshness

Last verified in this catalog Oct 18, 2026. Significant claims (KEV, EPSS, CVSS, affected ranges) come from the source rows above — open the original publisher for the authoritative advisory.