Findings

CVE-2026-15588

A denial-of-service and resource exhaustion vulnerability exists within the component of GLib.

Published Jul 20, 2026 · updated Oct 14, 2026

A denial-of-service and resource exhaustion vulnerability exists within the component of GLib. The authentication mechanism fails to enforce proper length limitations on data lines read from a client. An unauthenticated local or remote attacker can exploit this lack of input validation by sending excessively long streams of data, causing the application to consume massive amounts of system memory and CPU, potentially leading to a crash or system hang.

Timeline

Detection, updates, and resolution for this record.

  1. Jul 20, 2026 · NIST NVD

    Detected

    A denial-of-service and resource exhaustion vulnerability exists within the component of GLib. The authentication mechanism fails to enforce proper length limitations on data lines read from a client. An unauthenticated local or remote attacker can exploit this lack of input validation by sending excessively long streams of data, causing the application to consume massive amounts of system memory

  2. Oct 14, 2026 · NIST NVD

    Updated

    A denial-of-service and resource exhaustion vulnerability exists within the component of GLib. The authentication mechanism fails to enforce proper length limitations on data lines read from a client. An unauthenticated local or remote attacker can exploit this lack of input validation by sending excessively long streams of data, causing the application to consume massive amounts of system memory

Sources

  • CVE.orgCVE-2026-15588

    Official CVE identifier

    cve.org
  • FIRST EPSSCVE-2026-15588

    30-day exploitation probability 0.5%

    first.org
  • NIST NVDCVE-2026-15588

    A denial-of-service and resource exhaustion vulnerability exists within the component of GLib. The authentication mechanism fails to enforce proper length limitations on data lines read from a client. An unauthenticated local or remote attacker can exploit thi

    nvd.nist.gov

References