Findings

CVE-2026-17250

A stack-based buffer overflow vulnerability exists in the firmware update functionality of TL-MR6400 v7 due to unsafe processing of attacker-controlled metadata within…

Published Aug 21, 2026 · updated Oct 14, 2026

A stack-based buffer overflow vulnerability exists in the firmware update functionality of TL-MR6400 v7 due to unsafe processing of attacker-controlled metadata within a firmware image. Successful exploitation may allow an authenticated attacker to trigger memory corruption and execute arbitrary code on the affected device.

Code

The project this record applies to. Exploit listings stay in References.

No public source repository is identified for this product.

Timeline

Detection, updates, and resolution for this record.

  1. Aug 21, 2026 · NIST NVD

    Detected

    A stack-based buffer overflow vulnerability exists in the firmware update functionality of TL-MR6400 v7 due to unsafe processing of attacker-controlled metadata within a firmware image. Successful exploitation may allow an authenticated attacker to trigger memory corruption and execute arbitrary code on the affected device.

  2. Oct 14, 2026 · NIST NVD

    Updated

    A stack-based buffer overflow vulnerability exists in the firmware update functionality of TL-MR6400 v7 due to unsafe processing of attacker-controlled metadata within a firmware image. Successful exploitation may allow an authenticated attacker to trigger memory corruption and execute arbitrary code on the affected device.

Sources

  • CVE.orgVulnerability recordCVE-2026-17250

    Official CVE identifier

    cve.org
  • FIRST EPSSExploitation probabilityCVE-2026-17250

    30-day exploitation probability 0.3%

    first.org
  • NIST NVDVulnerability recordCVE-2026-17250

    A stack-based buffer overflow vulnerability exists in the firmware update functionality of TL-MR6400 v7 due to unsafe processing of attacker-controlled metadata within a firmware image. Successful exploitation may allow an authenticated attacker to trigger memory corruption

    nvd.nist.gov

References