Findings

CVE-2026-26399

A stack-use-after-return issue exists in the Arduino_Core_STM32 library prior to version 1.7.0.

Published Apr 20, 2026 · updated Jun 17, 2026

A stack-use-after-return issue exists in the Arduino_Core_STM32 library prior to version 1.7.0. The pwm_start() function allocates a TIM_HandleTypeDef structure on the stack and passes its address to HAL initialization routines, where it is stored in a global timer handle registry. After the function returns, interrupt service routines may dereference this dangling pointer, resulting in memory corruption.

Code

The project this record applies to. Exploit listings stay in References.

Timeline

Detection, updates, and resolution for this record.

  1. Apr 20, 2026 · NIST NVD

    Detected

    A stack-use-after-return issue exists in the Arduino_Core_STM32 library prior to version 1.7.0. The pwm_start() function allocates a TIM_HandleTypeDef structure on the stack and passes its address to HAL initialization routines, where it is stored in a global timer handle registry. After the function returns, interrupt service routines may dereference this dangling pointer, resulting in memory cor

  2. Jun 17, 2026 · NIST NVD

    Updated

    A stack-use-after-return issue exists in the Arduino_Core_STM32 library prior to version 1.7.0. The pwm_start() function allocates a TIM_HandleTypeDef structure on the stack and passes its address to HAL initialization routines, where it is stored in a global timer handle registry. After the function returns, interrupt service routines may dereference this dangling pointer, resulting in memory cor

Sources

  • CVE.orgVulnerability recordCVE-2026-26399

    Official CVE identifier

    cve.org
  • NIST NVDVulnerability recordCVE-2026-26399

    A stack-use-after-return issue exists in the Arduino_Core_STM32 library prior to version 1.7.0. The pwm_start() function allocates a TIM_HandleTypeDef structure on the stack and passes its address to HAL initialization routines, where it is stored in a global timer handle registr

    nvd.nist.gov

References