CVE-2026-31760
In the Linux kernel, the following vulnerability has been resolved: gpib: lpvo_usb: fix memory leak on disconnect The driver iterates over the registered USB interface…
Published May 1, 2026 · updated Jun 17, 2026 · linux linux kernel
In the Linux kernel, the following vulnerability has been resolved: gpib: lpvo_usb: fix memory leak on disconnect The driver iterates over the registered USB interfaces during GPIB attach and takes a reference to their USB devices until a match is found. These references are never released which leads to a memory leak when devices are disconnected. Fix the leak by dropping the unnecessary references.
Code
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Timeline
Detection, updates, and resolution for this record.
May 1, 2026 · NIST NVD
Detected
In the Linux kernel, the following vulnerability has been resolved: gpib: lpvo_usb: fix memory leak on disconnect The driver iterates over the registered USB interfaces during GPIB attach and takes a reference to their USB devices until a match is found. These references are never released which leads to a memory leak when devices are disconnected. Fix the leak by dropping the unnecessary referenc
Jun 17, 2026 · NIST NVD
Updated
In the Linux kernel, the following vulnerability has been resolved: gpib: lpvo_usb: fix memory leak on disconnect The driver iterates over the registered USB interfaces during GPIB attach and takes a reference to their USB devices until a match is found. These references are never released which leads to a memory leak when devices are disconnected. Fix the leak by dropping the unnecessary referenc
Affected
- cpe linux/linux kernelversion unspecified
- cpe linux/linux kernel7.0
Sources
- CVE.orgVulnerability recordCVE-2026-31760
Official CVE identifier
cve.org - NIST NVDVulnerability recordCVE-2026-31760
In the Linux kernel, the following vulnerability has been resolved: gpib: lpvo_usb: fix memory leak on disconnect The driver iterates over the registered USB interfaces during GPIB attach and takes a reference to their USB devices until a match is found. These references are ne
nvd.nist.gov