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Findings

CVE-2026-7684

A security vulnerability has been detected in Edimax BR-6428nC up to 1.16.

Published May 3, 2026 · updated Jun 17, 2026

A security vulnerability has been detected in Edimax BR-6428nC up to 1.16. This impacts an unknown function of the file /goform/setWAN. Such manipulation of the argument pptpDfGateway leads to buffer overflow. The attack can be launched remotely. The exploit has been disclosed publicly and may be used. The vendor was contacted early about this disclosure but did not respond in any way.

Code

The project this record applies to. Exploit listings stay in References.

No public source repository is identified for this product.

Timeline

Detection, updates, and resolution for this record.

  1. May 3, 2026 · NIST NVD

    Detected

    A security vulnerability has been detected in Edimax BR-6428nC up to 1.16. This impacts an unknown function of the file /goform/setWAN. Such manipulation of the argument pptpDfGateway leads to buffer overflow. The attack can be launched remotely. The exploit has been disclosed publicly and may be used. The vendor was contacted early about this disclosure but did not respond in any way.

  2. Jun 17, 2026 · NIST NVD

    Updated

    A security vulnerability has been detected in Edimax BR-6428nC up to 1.16. This impacts an unknown function of the file /goform/setWAN. Such manipulation of the argument pptpDfGateway leads to buffer overflow. The attack can be launched remotely. The exploit has been disclosed publicly and may be used. The vendor was contacted early about this disclosure but did not respond in any way.

Sources

  • CVE.orgVulnerability recordCVE-2026-7684

    Official CVE identifier

    cve.org
  • NIST NVDVulnerability recordCVE-2026-7684

    A security vulnerability has been detected in Edimax BR-6428nC up to 1.16. This impacts an unknown function of the file /goform/setWAN. Such manipulation of the argument pptpDfGateway leads to buffer overflow. The attack can be launched remotely. The exploit has been disclosed p

    nvd.nist.gov

References