Findings

CVE-2026-85444

MOOS-IvP through 24.8.1 contains a buffer over-read vulnerability in isQuoted(), isBraced(), and isChevroned() functions that strip whitespace but index using the orig…

Published Sep 3, 2026 · updated Oct 14, 2026 · mit moos-ivp

MOOS-IvP through 24.8.1 contains a buffer over-read vulnerability in isQuoted(), isBraced(), and isChevroned() functions that strip whitespace but index using the original string length. Attackers can send NODE_REPORT messages with leading or trailing whitespace to read past buffer bounds and access adjacent memory.

Code

The project this record applies to. Exploit listings stay in References.

Timeline

Detection, updates, and resolution for this record.

  1. Sep 3, 2026 · NIST NVD

    Detected

    MOOS-IvP through 24.8.1 contains a buffer over-read vulnerability in isQuoted(), isBraced(), and isChevroned() functions that strip whitespace but index using the original string length. Attackers can send NODE_REPORT messages with leading or trailing whitespace to read past buffer bounds and access adjacent memory.

  2. Oct 14, 2026 · NIST NVD

    Updated

    MOOS-IvP through 24.8.1 contains a buffer over-read vulnerability in isQuoted(), isBraced(), and isChevroned() functions that strip whitespace but index using the original string length. Attackers can send NODE_REPORT messages with leading or trailing whitespace to read past buffer bounds and access adjacent memory.

Affected

  • cpe mit/moos-ivpversion unspecified

Sources

  • CVE.orgVulnerability recordCVE-2026-85444

    Official CVE identifier

    cve.org
  • FIRST EPSSExploitation probabilityCVE-2026-85444

    30-day exploitation probability 0.8%

    first.org
  • NIST NVDVulnerability recordCVE-2026-85444

    MOOS-IvP through 24.8.1 contains a buffer over-read vulnerability in isQuoted(), isBraced(), and isChevroned() functions that strip whitespace but index using the original string length. Attackers can send NODE_REPORT messages with leading or trailing whitespace to read past buff

    nvd.nist.gov

References